Test handoff / free preflight tool
Wafer Test CSV Map & Yield Report
Map explicit PASS, FAIL and EXCLUDE die coordinates. Resolve retests only with a stated policy and show exactly which sites enter the yield denominator.
What to provide
CSV columns wafer,x,y,bin,status. Status must be PASS, FAIL or EXCLUDE; choose error, first-row or last-row retest handling.
What you get
Per-wafer die-coordinate maps, status/bin counts and yield from selected unique PASS plus FAIL sites.
Starting from STDF? The source package includes an optional offline STDF V4 PRR-to-CSV converter. It requires a single WIR/WRR wafer, explicit bin mapping and retest policy. STDF is not uploaded or parsed by this page.
No current result. Review inputs, then run the check. Editing an input clears the previous report.
Disclaimer: This tool and its outputs are for reference and preliminary evaluation only, not design, manufacturing, qualification or commercial approval; verify all results with the responsible supplier or engineer.
Original MIT-licensed models, Node CLI, synthetic tests and optional Python readers. No customer files or dependency environment is included. Read the bundled README and third-party notices before use or redistribution.
Source archive SHA256Before using this in a handoff
Browser input is CSV only. The optional offline STDF V4 converter requires an explicit bin map and retest policy. Neither route proves wafer qualification or infers pass/fail from bin numbers.
All built-in examples are synthetic, not product data, customer evidence or supplier commitments. Retain the input revision and review the downloaded report with the responsible provider.