Free planning tool
Test Cost & Yield Calculator
Model the test line before you commit volume. Enter your ATE hourly rate, per-device test time, handler cost, volume and expected yield to see cost per device tested and — the number that actually hits margin — cost per good unit.
Use your ATE hourly rate (older platforms ~$200–400/hr, advanced SoC testers $1,500–3,000/hr), the per-device test time, handler/sorter cost and the expected good-unit yield.
Test cost per good unit
$3.1228
Raw test cost per device tested: $2.9667
ATE $/device
$2.9167
Handler $/device
$0.0500
Total test spend
$29,667
Good units
9,500
Cost / good unit
$3.1228
At +5% yield
$2.9667
save 5.0%
ATE rate
$350/h
Test time
30s
Cost per good unit = (ATE cost + handler cost) ÷ good-unit yield, because you pay to test every device, including failures. A 5-point yield gain from 95% to 100% would cut cost per good unit by about 5.0% — the single biggest test-cost lever after test time.
WHY YIELD DOMINATES
You pay to test every die — including the fails
Test cost per good unit divides your total test spend by the good units only. Because every device is tested, a lower yield spreads the same ATE and handler cost across fewer shippable parts — which is why a few yield points often beat a faster handler.
Want a foundry- and OSAT-verified test plan with real ATE rates? Request a quote and we will model it against current test-house capacity.